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BSI
FEATURES
Very Low Power/Voltage CMOS SRAM 128K X 16 bit
DESCRIPTION
BS616LV2011
* Very low operation voltage : 2.4 ~ 5.5V * Very low power consumption : Vcc = 3.0V C-grade: 20mA (Max.) operating current I-grade: 25mA (Max.) operating current 0.1uA (Typ.) CMOS standby current Vcc = 5.0V C-grade: 40mA (Max.) operating current I -grade: 45mA (Max.) operating current 0.6uA (Typ.) CMOS standby current * High speed access time : -70 70ns (Max.) at Vcc = 3.0V -10 100ns (Max.) at Vcc = 3.0V * Automatic power down when chip is deselected * Three state outputs and TTL compatible * Fully static operation * Data retention supply voltage as low as 1.5V * Easy expansion with CE and OE options * I/O Configuration x8/x16 selectable by LB and UB pin
The BS616LV2011 is a high performance, very low power CMOS Static Random Access Memory organized as 131,072 words by 16 bits and operates from a wide range of 2.4V to 5.5V supply voltage. Advanced CMOS technology and circuit techniques provide both high speed and low power features with a typical CMOS standby current of 0.1uA and maximum access time of 70/100ns in 3V operation. Easy memory expansion is provided by an active LOW chip enable(CE), active LOW output enable(OE) and three-state output drivers. The BS616LV2011 has an automatic power down feature, reducing the power consumption significantly when chip is deselected. The BS616LV2011 is available in DICE form, JEDEC standard 44-pin TSOP Type II package , JEDEC standard 48-pin TSOP Type I package and 48-ball BGA package.
PRODUCT FAMILY
PRODUCT FAMILY BS616LV2011DC BS616LV2011EC BS616LV2011TC BS616LV2011AC BS616LV2011DI BS616LV2011EI BS616LV2011TI BS616LV2011AI OPERATING TEMPERATURE Vcc RANGE
SPEED ( ns ) Vcc= 3.0V
( ICCSB1, Max )
POWER DISSIPATION STANDBY Operating
( ICC, Max )
PKG TYPE DICE TSOP2-44 TSOP1-48 BGA-48-0608 DICE TSOP2-44 TSOP1-48 BGA-48-0608
Vcc= 3.0V 0.7uA
Vcc= 5.0V 6uA
Vcc= 3.0V 20mA
Vcc= 5.0V 40mA
+0 C to +70 C
O
O
2.4V ~ 5.5V
70/100
-40 O C to +85 O C
2.4V ~ 5.5V
70/100
1.5uA
25uA
25mA
45mA
PIN CONFIGURATIONS
A4 A3 A2 A1 A0 CE DQ0 DQ1 DQ2 DQ3 VCC GND DQ4 DQ5 DQ6 DQ7 WE A16 A15 A14 A13 A12 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 A5 A6 A7 OE UB LB DQ15 DQ14 DQ13 DQ12 GND VCC DQ11 DQ10 DQ9 DQ8 NC A8 A9 A10 A11 NC
BLOCK DIAGRAM
A8 A13 A15 A16 A14 A12 A7 A6 A5 A4 2048 DQ0 16 Data Input Buffer 16 Column I/O Address Input Buffer 20 Row Decoder 1024 Memory Array 1024 x 2048
BS616LV2011EC BS616LV2011EI
1
2
3 A0 A3 A5 N.C. N.C. A14 A12 A9
4 A1 A4 A6 A7 A16 A15 A13 A10
5 A2
6 N.C. D0 D2 VCC VSS D6 D7 N.C.
A B C D E F G H
LB D8 D9 VSS VCC D14 D15 N.C.
OE UB D10 D11 D12 D13 N.C. A8
. . . .
DQ15
. . . .
Write Driver
Sense Amp 128 Column Decoder
16
Data Output
16
Buffer
CE D1 D3 D4 D5 WE A11
CE WE OE UB LB Vcc Gnd Control
14 Address Input Buffer
A11 A9 A3 A2 A1 A0 A10
Brilliance Semiconductor Inc. reserves the right to modify document contents without notice.
R0201-BS616LV2011
48-ball BGA top view
1
Revision 2.5 April 2002
BSI
PIN DESCRIPTIONS
BS616LV2011
Name
A0-A16 Address Input CE Chip Enable Input
Function
These 17 address inputs select one of the 131,072 x 16-bit words in the RAM. CE is active LOW. Chip enables must be active when data read from or write to the device. if chip enable is not active, the device is deselected and is in a standby power mode. The DQ pins will be in the high impedance state when the device is deselected.
WE Write Enable Input
The write enable input is active LOW and controls read and write operations. With the chip selected, when WE is HIGH and OE is LOW, output data will be present on the DQ pins; when WE is LOW, the data present on the DQ pins will be written into the selected memory location.
OE Output Enable Input
The output enable input is active LOW. If the output enable is active while the chip is selected and the write enable is inactive, data will be present on the DQ pins and they will be enabled. The DQ pins will be in the high impedance state when OE is inactive.
LB and UB Data Byte Control Input DQ0 - DQ15 Data Input/Output Ports Vcc Gnd
Lower byte and upper byte data input/output control pins. These 16 bi-directional ports are used to read data from or write data into the RAM. Power Supply Ground
TRUTH TABLE MODE Not selected (Power Down) Output Disabled Read CE H L L WE X H H OE X H L LB X X L H L L Write L L X H L UB X X L L H L L H DQ0~DQ7 High Z High Z Dout High Z Dout Din X Din DQ8~DQ15 High Z High Z Dout Dout High Z Din Din X Vcc CURRENT ICCSB ICCSB1 , ICC ICC ICC ICC ICC ICC ICC
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BSI
ABSOLUTE MAXIMUM RATINGS(1)
SYMBOL VTERM TBIAS TSTG PT IOUT PARAMETER
Terminal Voltage Respect to GND with
BS616LV2011
OPERATING RANGE
UNITS
V
O
RATING
-0.5 to Vcc+0.5 -40 to +125 -60 to +150 1.0 20
RANGE
Commercial Industrial
AMBIENT TEMPERATURE
0 O C to +70 O C -40 O C to +85 O C
Vcc
2.4V ~ 5.5V 2.4V ~ 5.5V
Temperature Under Bias Storage Temperature Power Dissipation DC Output Current
C C
O
W mA
CAPACITANCE (1) (TA = 25oC, f = 1.0 MHz)
SYMBOL
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
CIN CDQ
PARAMETER Input Capacitance Input/Output Capacitance
CONDITIONS
MAX.
UNIT
VIN=0V VI/O=0V
6 8
pF pF
1. This parameter is guaranteed and not tested.
DC ELECTRICAL CHARACTERISTICS ( TA = 0 to + 70oC )
PARAMETER NAME
VIL VIH IIL IOL VOL VOH ICC ICCSB ICCSB1
PARAMETER
Guaranteed Input Low (2) Voltage Guaranteed Input High Voltage(2) Input Leakage Current Output Leakage Current Output Low Voltage Output High Voltage Operating Power Supply Current Standby Current -TTL Standby Current-CMOS
TEST CONDITIONS
Vcc=3.0V Vcc=5.0V Vcc=3.0V Vcc=5.0V
MIN. TYP. (1) MAX.
-0.5 2.0 2.2 --Vcc=3.0V Vcc=5.0V Vcc=3.0V Vcc=5.0V Vcc=3.0V Vcc=5.0V Vcc=3.0V Vcc=5.0V Vcc=3.0V
UNITS V V uA uA V V mA mA uA
----------0.1 0.6
0.8 Vcc+0.2 1 1 0.4 -20 40 0.5 1 0.7 6
Vcc = Max, VIN = 0V to Vcc Vcc = Max, CE = VIH, or OE = VIH, VI/O = 0V to Vcc Vcc = Max, IOL = 2mA Vcc = Min, IOH = -1mA CE = VIL, IDQ = 0mA, F = Fmax(3) CE = VIH, IDQ = 0mA CE VIN Vcc-0.2V, Vcc - 0.2V or VIN 0.2V
-2.4 -------
Vcc=5.0V
1. Typical characteristics are at TA = 25oC. 2. These are absolute values with respect to device ground and all overshoots due to system or tester notice are included. 3. Fmax = 1/tRC .
DATA RETENTION CHARACTERISTICS ( TA = 0 to + 70oC )
SYMBOL
VDR ICCDR tCDR tR
PARAMETER
Vcc for Data Retention Data Retention Current Chip Deselect to Data Retention Time Operation Recovery Time CE VIN CE VIN
TEST CONDITIONS
Vcc - 0.2V Vcc - 0.2V or VIN Vcc - 0.2V Vcc - 0.2V or VIN 0.2V 0.2V
MIN.
1.5 -0 TRC (2)
TYP. (1)
-0.05 ---
MAX.
-0.5 ---
UNITS
V uA ns ns
See Retention Waveform
1. Vcc = 1.5V, TA = + 25OC 2. tRC = Read Cycle Time R0201-BS616LV2011
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Revision 2.5 April 2002
BSI
LOW VCC DATA RETENTION WAVEFORM ( CE Controlled )
Data Retention Mode
BS616LV2011
VDR 1.5V
Vcc
VIH
Vcc
Vcc
t CDR
CE Vcc - 0.2V
tR
VIH
CE
AC TEST CONDITIONS
Input Pulse Levels Input Rise and Fall Times Input and Output Timing Reference Level Vcc/0V 5ns 0.5Vcc
KEY TO SWITCHING WAVEFORMS
WAVEFORM INPUTS MUST BE STEADY MAY CHANGE FROM H TO L
1269
OUTPUTS MUST BE STEADY WILL BE CHANGE FROM H TO L WILL BE CHANGE FROM L TO H CHANGE : STATE UNKNOWN CENTER LINE IS HIGH IMPEDANCE "OFF "STATE
AC TEST LOADS AND WAVEFORMS
3.3V OUTPUT
100PF
INCLUDING JIG AND SCOPE
1269
3.3V OUTPUT
MAY CHANGE FROM L TO H DON T CARE: ANY CHANGE PERMITTED DOES NOT APPLY
5PF 1404
INCLUDING JIG AND SCOPE
,
1404
FIGURE 1A
THEVENIN EQUIVALENT 667 ALL INPUT PULSES
FIGURE 1B
OUTPUT
1.73V
Vcc GND
10%
90% 90%
10%
5ns
FIGURE 2
AC ELECTRICAL CHARACTERISTICS ( TA = 0 to + 70oC , Vcc = 3.0V )
READ CYCLE
JEDEC PARAMETER PARAMETER NAME NAME DESCRIPTION
Read Cycle Time Address Access Time Chip Select Access Time Data Byte Control Access Time Output Enable to Output Valid Chip Select to Output Low Z Data Byte Control to Output Low Z Output Enable to Output in Low Z Chip Deselect to Output in High Z BS616LV2011-70 MIN. TYP. MAX. BS616LV2011-10 MIN. TYP. MAX.
UNIT ns ns ns ns ns ns ns ns ns ns ns ns
tAVAX tAVQV tELQV tBA tGLQV tELQX tBE tGLQX tEHQZ tBDO tGHQZ tAXOX
tRC t AA t ACS tBA(1) tOE tCLZ tBE tOLZ tCHZ tBDO tOHZ tOH
70 -(CE) (LB,UB) (CE) (LB,UB) (CE) ---10 10 10 0 0 0 10
-------------
-70 70 35 35 ---35 35 30 --
100 ----15 15 15 0 0 0 15
-------------
-100 100 50 50 ---40 40 35 --
Data Byte Control to Output High Z (LB,UB) Output Disable to Output in High Z Output Disable to Address Change
NOTE : 1. tBA is 35ns/50ns (@speed=70ns/100ns) with address toggle. ; .tBA is 70ns/100ns (@speed=70ns/100ns) without address toggle. R0201-BS616LV2011
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Revision 2.5 April 2002
BSI
SWITCHING WAVEFORMS (READ CYCLE)
READ CYCLE1 (1,2,4)
BS616LV2011
t RC
ADDRESS
t
D OUT
t
OH
AA
t OH
READ CYCLE2 (1,3,4)
CE
t ACS t BA
LB,UB
t BE
D OUT
t
(5) CLZ
t BDO
t
CHZ
(5)
READ CYCLE3 (1,4)
t RC
ADDRESS
t
OE
AA
t OE
CE
t OH
t OLZ t CLZ
(5)
t
ACS
t OHZ (5) (1,5) t CHZ t BA
LB,UB
t BE
D OUT NOTES: 1. WE is high for read Cycle. 2. Device is continuously selected when CE = VIL. 3. Address valid prior to or coincident with CE transition low. 4. OE = VIL .
t BDO
5. Transition is measured 500mV from steady state with CL = 5pF as shown in Figure 1B. The parameter is guaranteed but not 100% tested. R0201-BS616LV2011 Revision 2.5 April 2002
5
BSI
AC ELECTRICAL CHARACTERISTICS ( TA = 0 to + 70oC , Vcc = 3.0V )
WRITE CYCLE
JEDEC PARAMETER NAME PARAMETER NAME DESCRIPTION
Write Cycle Time Chip Select to End of Write Address Setup Time Address Valid to End of Write Write Pulse Width Write recovery Time Date Byte Control to End of Write Write to Output in High Z Data to Write Time Overlap Data Hold from Write Time Output Disable to Output in High Z End of Write to Output Active
BS616LV2011
BS616LV2011-70 MIN. TYP. MAX. BS616LV2011-10 MIN. TYP. MAX.
UNIT ns ns ns ns ns ns ns ns ns ns ns ns
tAVAX t E1LWH tAVWL tAVWH tWLWH tWHAX tBW tWLQZ tDVWH tWHDX tGHQZ tWHOX
t WC t CW t AS t AW t WP t WR t BW(1) t WHZ t DW t DH t OHZ t OW
70 70 0 70 35 (CE,WE) (LB,UB) 0 30 0 30 0 0 5
-------------
-------30 --30 --
100 100 0 100 50 0 40 0 40 0 0 10
-------------
-------40 --40 --
NOTE : 1. tBW is 30ns/40ns (@speed=70ns/100ns) with address toggle. ; tBW is 70ns/100ns (@speed=70ns/100ns) without address toggle.
SWITCHING WAVEFORMS (WRITE CYCLE)
WRITE CYCLE1 (1)
t WC
ADDRESS
t WR
OE
(3)
t CW
CE
(5)
(11)
t BW
LB,UB
t AW
WE
(3)
t AS
(4,10)
t WP
(2)
t OHZ
D OUT
t t DW
DH
D IN
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Revision 2.5 April 2002
BSI
WRITE CYCLE2 (1,6)
BS616LV2011
t WC
ADDRESS
t CW
CE
(5)
(11)
t BW
LB,UB
t AW
WE
t WR t WP
(2)
(3)
t AS
(4,10)
t
DH
t WHZ
D OUT
(7)
(8)
t DW t
DH (8,9)
D IN
NOTES: 1. WE must be high during address transitions. 2. The internal write time of the memory is defined by the overlap of CE and WE low. All signals must be active to initiate a write and any one signal can terminate a write by going inactive. The data input setup and hold timing should be referenced to the second transition edge of the signal that terminates the write. 3. TWR is measured from the earlier of CE or WE going high at the end of write cycle. 4. During this period, DQ pins are in the output state so that the input signals of opposite phase to the outputs must not be applied. 5. If the CE low transition occurs simultaneously with the WE low transitions or after the WE transition, output remain in a high impedance state. 6. OE is continuously low (OE = VIL ). 7. DOUT is the same phase of write data of this write cycle. 8. DOUT is the read data of next address. 9. If CE is low during this period, DQ pins are in the output state. Then the data input signals of opposite phase to the outputs must not be applied to them. 10. Transition is measured 500mV from steady state with CL = 5pF as shown in Figure 1B. The parameter is guaranteed but not 100% tested. 11. TCW is measured from the later of CE going low to the end of write.
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Revision 2.5 April 2002
BSI
ORDERING INFORMATION
BS616LV2011
BS616LV2011
XX
-- Y Y
SPEED 70: 70ns 10: 100ns
GRADE C: +0oC ~ +70oC I: -40oC ~ +85oC PACKAGE E: TSOP 2 - 44 PIN T: TSOP 1 - 48 PIN A: BGA - 48 PIN(6x8mm) D: DICE
PACKAGE DIMENSIONS
TSOP2-44
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Revision 2.5 April 2002
BSI
PACKAGE DIMENSIONS
12 (2X) HD C L 1 48 12 (2X) UNIT SYMBOL
BS616LV2011
24
25 "A" D
Seating Plane
y
12 (2x)
A A1 A2 b b1 c c1 D E e HD L L1 y
INCH 0.0433 0.004 0.004 0.002 0.039 0.002 0.009 0.002 0.008 0.001 0.004 ~ 0.008 0.004 ~ 0.006 0.645 0.004 0.472 0.004 0.020 0.004 0.708 0.008 0.0236 0.006 0.0315 0.004 0.004 Max. 0~ 8
MM 1.10 0.10 0.10 0.05 1.00 0.05 0.22 0.05 0.20 0.03 0.10 ~ 0.21 0.10 ~ 0.16 16.40 0.10 12.00 0.10 0.50 0.10 18.00 0.20 0.60 0.15 0.80 0.10 0.1 Max. 0~ 8
b E
e
A
A2
GAUGE PLANE A 0.254
A1
24
25
SEATING PLANE 12 (2x) WITH PLATING
A L L1
b
"A" DETAIL VIEW
c c1
BASE METAL
b1
SECTION A-A
1
48
TSOP1-48PIN
A15 A14 A13 A12 A11 A10 A9 A8 NC NC /WE CE2 NC /UB /LB NC NC A7 A6 A5 A4 A3 A2 A1 1 48 47 46 A16 NC VSS IO15 IO7 IO14 IO6 IO13 IO5 IO12 IO4 VCC IO11 IO3 IO10 IO2 IO9 IO1 IO8 IO0 /OE VSS /CE A0
9 10 13 16 17
Pkg Type : 48TSOP(I)-12x18mm
37
27 24 25
0
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Revision 2.5 April 2002
BSI
PACKAGE DIMENSIONS (continued)
NOTES:
BS616LV2011
1: CONTROLLING DIMENSIONS ARE IN MILLIMETERS. 2: PIN#1 DOT MARKING BY LASER OR PAD PRINT. 3: SYMBOL "N" IS THE NUMBER OF SOLDER BALLS.
1.4 Max.
BALL PITCH e = 0.75 D 8.0 E 6.0 N 48 D1 5.25 E1 3.75
D1
e
VIEW A
48 mini-BGA (6 x 8)
E1
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Revision 2.5 April 2002
BSI
REVISION HISTORY
Revision
2.2 2.3 2.4 2.5
BS616LV2011
Description
2001 Data Sheet release Modify Standby Current (Typ. and Max.) Modify CSP Pin Configuration Pin number : E3 " VSS " rename to " N.C. " Modify some AC parameters. Modify 5V ICCSB1_Max(I-grade) from 10uA to 25uA.
Date
Apr. 15, 2001 Jun. 29, 2001 Sep.12, 2001 April,12,2002
Note
R0201-BS616LV2011
11
Revision 2.5 April 2002

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